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EasyTest Bed of Nails
FTSL have been the EasyTest product family has been developed over a number of years to fulfil a range of pcb test requirements. The 3 basic family products have overlapping expandability as standard and are capable of meeting all your test needs.
Testability:
The 3 EasyTest products, have been specifically designed to meet even the most demanding test requirements. The EasyTest family can fully support the following test capabilities:
Scalability:
The EasyTest family provides you with a fully scalable test solution starting with a simple entry level capability; it is scalable to a highly advanced test solution.
In Circuit Test with power on or off Vectorless test utilising 3 open pin detection techniques Vector test Optical AOI Boundary Scan ISP Programming Powered functional test Cluster test Automotive & Aerospace/Defence protocol Communications protocol For full product specification please email sales@flyingtest.co.uk
Proven Technology:
With over 20 years in the market the EasyTest family has a proven track record for reliability and technology, utilised in all areas of the electronics manufacturing for the validation of assembled pcb's.
EasyTest family consist of 3 systems which our outlined below:
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EasyTest 105A
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The E105A is an entry level test system, with a small footprint configurable from 64 to 1254 test points. The system is capable of full analogue ICT testing, as well as limited powered functional test capability. The system can be fitted with either a vacuum fixture interface or SPEA low cost fixture solution pneumatic interface. |
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EasyTest 100A
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The E100A is a high performance analogue ICT test system incorporating all the features of the E105A with the addition of full functional power test capability. |
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EasyTest 500AD
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The most advanced test solution available in the EasyTest family the E500AD is has all the capability of the E100A but with a maximum test point count of 1280. The E500AD also has the additional capability of being able to test digital IC through the use of direct non multiplexed Vector testing. |
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