Mixed signal test platforms
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The Comptest MX is an open architecture mixed signal test platform family comprising of 4 test platforms consisting of C372M, C340MX, C322MX and C320MX. These test systems are capable of testing analogue, digital and power devices on each test system. The system utilises ATOS C2 SPEA system and programming operating system incorporating VRAD (very rapid applications development). |
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C3320 TFT/LCD IC Driver Tester
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The C3320TFT is capable of testing the next generation LCD and TFT device driver's utalising the Comptest open architecture it is capable of testing devices with pin counts up to 2048. This feature rich tester incorporates V/I resources as well as full DSP capability to meet even the most demanding requirements for the testing of TFT drivers. |
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C3320 RFID Smart Card Tester
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The C3320 RFID is SPEA contactless Smart Card test platform, capable of simultaneous device testing via its parallel system architecture. The system can be configured to test wafers, final test utalsing 2 RF pads and antenna. |
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C3372 Audio
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The C3372 Audio has been specifically developed for the special requirement of audio device testing. The system comes as standard with the capability to functional test switching amplifier. |
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C3320SVM
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The C3320SVM is a procession measurement system used for the testing of advanced sensing technology. Capable of measuring in both femtofarads (capacitance) and picoampere (current) the tester is one of the most advanced test platform avalaible in the world. |
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CT1120
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The CT1120 is a hybrid test solution for the testing of UHF tags at frequencies up to 900 MHz, combining the best in class test instruments for the Comptest range of products with those of the SPEA 3030 test platform. |
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H1000 Series
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The H1000 series of handlers have been developed to work in conjunction with the Comptest platform products to automate the handling of devices for testing. The system uses a high resolution digital camera for indexing, device management and optical test. |
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H1650
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H1650 is a reel to reel handler system for high speed handling of reeled packaged devices. The system offers a fully flexible production handling system that can be configured to meet the most demanding needs. |
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H1550
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The H1000 series of handlers have been developed to work in conjunction with the Comptest platform products to automate the handling of devices for testing. The system uses a high resolution digital camera for indexing, device management and optical test. |
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H3000 Series
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The H3550 is a pick and place handler used for the handling of devices supplied waffle trays, the system can be interacted with any Comptest product. |
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H3550
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The H3550 has been developed to be modular in design and use enabling it to be specified to meet your specific handling requirements for different device packages. The production configuration is a top down design engineered for maximum through put, therefore delivering cost effecting testing . The production option enable the fully automated handling of devices form input tray to tested output tray. The system utilises linear motor technology developed by SPEA over the last 10 years on the world class flying probe system. |
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H3250
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The H3550 is a pick and place handler used for the handling of devices supplied waffle trays, the system can be interacted with any Comptest product. |
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BLU
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The BLU is a combined pick and place system with a fully automated burn in/environmental device test station. The system is capable of active device stimulus while being connected to any Comptest products. Stimulus capability rotational, acceleration and deceleration, pressure, thermal, optical. |
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