Full Coverage, Lowest Cost of Test
The SPEA 3030M is a multi-function, fully upgradable and customisable in-circuit tester, designed to combine full test coverage with the lowest cost of test in a single manual test system.
Modular and configurable with a wide range of instrumentation and receivers, it delivers up to 4x the throughput of a standard tester — which is what makes it a practical choice for medium-volume production where an in-line system is hard to justify.
As the sole UK & Ireland SPEA distributor since 2004, Flying Test Systems can advise on the right configuration, fixture strategy, and test coverage for your production.
Key Capabilities
The 3030M delivers full coverage at the lowest cost of test, in a manual system one operator can run.
Four Test Cores, One Operator
Four independent test cores give up to 4x the throughput of standard ICT while still being run by a single operator.
Save Field Returns
Catching process faults and structural defects before boards ship reduces the failures that come back from the field.
Fully Upgradable
Configurable and upgradable as your requirements change, so the system you buy is not the system you are stuck with.
Per-Pin Channels
A 1:1 instrument to receiver ratio with PC-independent architecture, so test speed is set by the tester rather than the PC.
Four Test Cores, One Operator
The 3030M can be equipped with up to four independent cores — each with its own CPU, local memory and instrumentation — testing up to four boards or panels in parallel.
That delivers up to 75% test cost reduction against a standard ICT system. One system, one operator, one handling operation, one fixture and one PC to test four PCBAs simultaneously.
One or more 4-core flashing modules can program different-type components in parallel, loading system software or programming BIST/BOST functions during the test stage rather than as a separate operation.
Save Money, Save Time, Save Field Returns
Save money. Multiple test techniques execute within one system rather than across several test stations — no extra operator, a single test program, less floor space, faster training and lower running costs.
Save time. Expensive and unnecessary handling operations are avoided. One board load and unload covers every test, optimised to avoid redundancy and over-test. With Leonardo, generating a multi-function test program takes minutes.
Save field returns. Running every technique on the same tester used for ICT removes the handling risk between stages. At the end of test the product is ready to ship — and the 3030M's instrumentation and stimuli reliably find faults that standard ICT systems miss.
Fully Upgradable and Customisable
The 3030M can be factory-equipped or upgraded in the field with whatever instrumentation the test requirement demands — including power instrumentation such as programmable AC/DC generators, active loads, power matrix and programmable power supplies, as well as third-party instruments.
It accommodates a wide range of fixture receiver models, including third-party types from Genrad, Ingun, Zentel and Augat Pylon — so existing fixtures aren't automatically written off.
With motorized receivers, presser speed is programmable to suit the board, the descent is always planar, and different contacting levels can be programmed to test different areas of the assembly. A direct cable-less connection preserves signal integrity, and no compressed air is needed, so the system can be moved anywhere in the plant.
Per-Pin Channels, PC-Independent Test
Every 3030M channel is configurable by test program, so any nail can perform any kind of test. That 1:1 instrument-to-receiver ratio means faster test generation, easier ECO management, and full flexibility as the board changes.
The PC-independent architecture keeps the test program resident in the tester CPU, so test speed is set by the system rather than the PC. Antivirus and other applications don't slow it down, and the PC can be replaced or updated at any point without re-debugging the program.
SPEA's Common Architecture means Leonardo test programs run across all SPEA board test systems — the 3030 family and the flying probers — so production can move between systems as demand dictates.
Leonardo. Easy, Fast, Self-Programming.
Leonardo generates the test program automatically in minutes, with automatic debug and tuning, automatic CAD data recognition and import, and automatic test report generation.
It also produces the fixture drilling and wiring files automatically, minimising application development cost, and gives real-time production monitoring and analysis through an intuitive interface.
High-speed parametric ICT measures each component value in a very short time — microseconds for ICT against milliseconds for functional test — and identifies the faulty device automatically, cutting programming, test and repair time together.
Test Capabilities
Multiple test techniques within one system — including coverage standard ICT cannot reach.
Hi-Speed Parametric ICT
Boundary Scan
Open Pin Detection
Electro Scan
Junction Scan
Functional Test (Board & Cluster)
Multi-Device Flashing
Per-Pin Architecture
Power Instrumentation
Fixture & Program Migration
Other Bed of Nails Testers
SPEA 3030IL
Fully automatic in-line bed of nails tester with 4-core parallel test.
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SPEA 3030CE
Manual ICT fully compatible with 3030 Inline — fixture, presser and program move across.
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SPEA 3030C
Manual multi-core ICT for big boards — up to 1150 × 610mm and 6x parallel test.
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