High Volumes. High Quality. Low Cost of Test.
The SPEA 3030IL is a fully automatic bed of nails tester designed expressly to minimise the cost of test, delivering high throughput without requiring an operator to load the board or run the test.
It integrates quickly into SMEMA production lines, or runs with standard automatic board loaders and unloaders. Modular and fully upgradable, the 3030IL combines a wide range of test capabilities in a single integrated, high-throughput system.
As the sole UK & Ireland SPEA distributor since 2004, Flying Test Systems can advise on the right configuration, fixture strategy, and test coverage for your production.
Key Capabilities
The 3030IL brings four independent test cores and three-second handling to in-line production.
Four Cores, True Parallel Test
Four independent test cores each with their own CPU, memory and instrumentation, delivering up to 400% higher throughput than single-core ICT.
Three-Second Handling
Board handling in three seconds with no operator at the machine, keeping the tester working rather than waiting.
One Tester, Many Techniques
In-circuit test, flashing, functional test, boundary scan and optical inspection executed on a single system from one board loading.
Compatible With 3030 Manual
Fixture and test program transfer directly between the 3030IL and the manual 3030 series, so production can move between them.
Four Test Cores. True Parallel Test.
The 3030IL can be equipped with up to four independent test cores — each with its own CPU, local memory and instrumentation — able to test up to four boards or panels of boards in parallel.
Compared with a standard ICT system, that lifts throughput by up to 400%. A dedicated CPU on each core removes delay between instrumentation and PC, high-performance relays give fast switching, and different measurements can execute simultaneously.
Ultra-Fast Handling, No Operator
A redesigned handling module halves handling time against the previous generation. Three seconds covers a medium-size PCBA end to end — board loading, presser down, presser up and unloading.
The system needs no operator to load, unload, or run the test. Integrated into an SMEMA line or paired with SPEA's automatic board handling equipment, it runs fully unattended — and that handling equipment takes roughly a third of the floor space of traditional loaders.
One Tester, Many Test Techniques
Rather than buying several pieces of equipment, multiple test techniques execute within one system: no operator, a single test program, less floor space, faster training and lower operating costs.
With the Multi-Stage option the 3030IL runs different techniques concurrently — In-Circuit plus Functional, or In-Circuit plus Flashing — optimising the split across the two stages. One or more 4-core flashing modules can program different-type components in parallel.
Because every technique runs from one board loading, handling operations are avoided and the product is ready to ship at the end of test, which cuts the risk of damage from subsequent handling.
Fixture and Test Program Compatible with 3030 Manual
The 3030IL is fully compatible with 3030 manual systems. Production can migrate from in-line to manual and back without changing the fixture or the test program — useful during debug and board repair, and it keeps the in-line system free for other work.
Tester and receiver are fully integrated. The motorized receiver allows presser speed to be programmed to suit the board, the descent is always planar, and different contacting heights can be programmed to test different areas. A direct cable-less connection preserves signal integrity, and no compressed air is needed, so the system can be moved easily.
Leonardo. Easy, Fast, Self-Programming.
Leonardo generates the test program automatically in minutes, with automatic debug and tuning, automatic CAD data recognition and import, and automatic generation of the fixture drilling and wiring files.
High-speed parametric ICT measures each component value in a very short time — microseconds for ICT against milliseconds for functional test — and identifies the faulty device automatically, cutting programming, test and repair time.
The PC-independent architecture keeps the test program resident in the tester CPU, so test speed is set by the system rather than the PC. Antivirus and other applications don't affect it, and the PC can be changed or updated without re-debugging the program.
Test Capabilities
Multiple test techniques executed within a single integrated system.
In-Circuit Test
Open Pin Scan
Power On Test
Functional Test
Flashing
LED Light Test
Boundary Scan
Built-In-Self-Test
Optical Test
