Full Parallel Test
The SPEA T300 is a unique board test system supporting up to 32 parallel In-Circuit Test cores, with the additional capability of 256 cores for Flashing and Functional Test. Its Asynchronous Parallel Architecture performs tests and Flash in parallel on up to 32 PCBAs.
The T300 also includes SPEA's ICT-Plus test techniques, which detect many defects present in electronics that are not detectable with traditional ICT testing.
As the sole UK & Ireland SPEA distributor since 2004, Flying Test Systems can advise on the right configuration, fixture strategy, and test coverage for your production.
Key Capabilities
The T300 combines extreme parallelism with operatorless handling in a single test station.
Extreme Parallelism
Up to 32 high-performance in-circuit test cores, plus 256 cores each for flashing and functional test, running a huge number of tests simultaneously.
Single or Dual Test Site
Programmable as one large test site or two independent sites, so the same machine adapts to board size and production mix.
Operatorless Testing
Automatic board handling means the T300 runs without an operator at the machine, feeding continuously from racks.
Connected to the Digital Ecosystem
Industry 4.0 connectivity passes test and sensor data to your systems, opening the door to predictive maintenance.
A Huge Number of Tests and Flashing in Parallel
Most electronic printed circuit boards today are produced in panels composed of a high number of single boards, which in turn contain one or more components that need to be programmed.
The T300 was designed precisely to test and program a large number of boards in parallel — or a large number of sections of a single big board. That delivers high throughput and, as a direct consequence, very low cost of testing and programming.
Its 32 cores for in-circuit testing and 256 cores for Flash programming and functional testing make it unique on the market, providing 10x more throughput than the previous generation of ICT testers.
Programmable as Single or Dual Test Site
The T300 can be programmed to operate as a Single Test Site or a Dual Test Site. Single Test Site tests one panel of boards for ICT, Flash Programming and Functional test.
Dual Test Site tests two panels at the same time across all three techniques. To double throughput further, the system can perform a Split Test — running ICT on site 1 while simultaneously performing Flash Programming and/or Functional test on site 2.
Operatorless Testing
The T300 can be configured in several automatic operating modes that do not require an operator to be present: In-line Input with In-line Output, Rack Input with In-line Output, In-line Input with Rack Output, and Rack Input with Rack Output.
Robot rack loading is available as an option on the rack-fed modes, as is pass-fail selection on rack output. For a high-volume line, removing the operator from the test step removes both a labour cost and a source of handling variability.
Connected to the Digital Ecosystem
The T300 exchanges information, notifications and commands with the Industry 4.0 environment and the wider digital ecosystem.
Internal sensors monitor the state of the environment, the wearing parts, the moving parts, the pneumatic circuits and the internal and external power supplies — in order to support predictive maintenance, intercept defects that will cause malfunctions, and estimate the remaining life of components.
The system is conceived for long-lasting and intensive use in production, as well as for easy and quick maintenance.
ATOS Leonardo 4 ICT
ATOS Leonardo 4 ICT is the T300 version of the ATOS Operating System developed by SPEA for its testers.
ATOS includes all the tester operating and programming functions, making the system independent from the Windows version and from the configuration and performance of the system controller PC — so test speed and behaviour stay consistent regardless of what the controlling PC is doing.
Test Capabilities
In-Circuit Test, ICT-Plus, Flashing and Functional Test executed in parallel from one system.
In-Circuit Test
ICT-Plus
Flash Programming
Functional Test
Split Test
Single Test Site
Dual Test Site
Panel Test
Operatorless Operation
Predictive Maintenance
