Automatic Test of Big and Complex Boards
The SPEA 3030X is designed for the high-volume production test of power electronic boards, including power inverters, power supplies and power drivers.
The system handles large and heavy boards automatically by conveyor — 10kg and beyond — then tests the electronic parts (digital, analogue, power, high-voltage, supercapacitor, polarity and relay test) alongside mechanical parts such as magnets, LEDs and displays. Optical inspection, flashing and RTC calibration can run on the same equipment.
As the sole UK & Ireland SPEA distributor since 2004, Flying Test Systems can advise on the right configuration, fixture strategy, and test coverage for your production.
Key Capabilities
The 3030X combines automatic heavy-board handling with full in-circuit coverage in a sub-1m² footprint.
Catch Faults Before EOL
Brings failure rate at final functional test close to zero and practically eliminates field returns, with component-level diagnostics that name the failing part.
Heavy-Duty Handling
A high-speed conveyor handles boards up to 10kg and 150mm component height automatically, running without an operator and respecting SMT line takt time.
2x True Parallel Test
Two independent test cores with their own CPU, memory and instrumentation, testing two boards or panels at once within a footprint under one square metre.
One Machine, Full Coverage
ICT, functional, power-on, flashing, open pin scan, LED, boundary scan, BIST and optical test executed on a single system from one board loading.
Catch It Before Final Test
Testing power boards on the 3030X brings the failure rate at final functional (end-of-line) test close to zero, and practically eliminates field returns.
Repair costs drop sharply because component-level diagnostics identify the failing part — repair engineers aren't left hunting for the cause. Detecting failures early also avoids spending further production operations on boards that were already defective.
The knock-on effect is that functional and EOL test equipment can be simplified and final test time reduced, because the defects that would have shown up there have already been caught.
Heavy-Duty Conveyor, Operatorless
A high-speed heavy-duty conveyor handles large and heavy boards automatically, so the system runs without an operator and integrates directly into an SMT line or a test cell.
Throughput is high enough to respect SMT line takt time, which is what makes in-line power board test practical rather than a bottleneck — and keeps the cost of test down.
100% Coverage With One Machine
SPEA 3030 board testers are built to guarantee that PCBs work correctly for years, eliminating field returns — by testing 100% of the electronic, mechanical and electromechanical components on the board.
The 3030X performs a comprehensive range of test techniques in a single machine, detecting process defects and defective components together, so failures don't reach functional test and boards don't come back from the field.
Leonardo. Easy, Fast, Automatic.
The Leonardo operating system generates the test program automatically in minutes, with automatic debug and tuning, automatic CAD data recognition and import, and automatic test report generation.
It also generates the fixture drilling and wiring files automatically, which keeps application development cost down, and provides real-time production monitoring and analysis through an intuitive interface.
Technical Data
| Application | Mass production |
|---|---|
| Throughput | Very high |
| Test engine architecture | True Parallel Test Multi Core (2x) |
| Board size (L × W) | 560mm × 420mm (22” × 16.5”)* |
| Maximum board weight | Up to 10kg |
| Maximum component height | 150mm |
| Board handling | High-speed heavy-duty conveyor |
| Footprint (L × W) | 960mm × 960mm (<1m²) |
| Compatibility with standard 3030IL fixture | Yes |
* Contact us to discuss board sizes outside the standard envelope.
Test Capabilities
A comprehensive range of test techniques in a single machine.
In-Circuit Test
Functional Test
Power On Test
Flashing
Open Pin Scan
LED Light Test
Boundary Scan
Built-In-Self-Test
Optical Test
